Summary of "Introduction echantillon MEB"

Summary of “Introduction échantillon MEB”

The video provides a step-by-step guide on how to properly introduce samples into a Scanning Electron Microscope (SEM, or MEB in French) that uses a pressure chamber system. The main focus is on preparing the sample and ensuring the vacuum conditions are met before imaging.

Main Ideas and Concepts

Detailed Step-by-Step Methodology

  1. Check Sample Height: Ensure the sample height is suitable to pass through the pressure chamber door and avoid touching the microscope’s polar head.

  2. Bring Pressure Chamber to Atmospheric Pressure: Press the small button to release vacuum and equalize the secondary chamber to atmospheric pressure.

  3. Install Sample Holder: Screw the sample holder onto the rod inside the pressure chamber.

  4. Lock Holder and Close Door: Secure the sample holder and close the pressure chamber door.

  5. Create Vacuum in Secondary Chamber: Evacuate the secondary chamber to match the vacuum level of the main microscope chamber.

  6. Wait for Vacuum Equalization: Monitor the vacuum indicator; wait until it turns green, indicating equal pressure.

  7. Open Door to Main Chamber: Use the small lever to open the door once vacuum is equalized.

  8. Introduce Sample into Main Chamber: Place the sample inside the main chamber.

  9. Start Imaging: Turn on the electron beam (“cannon”) on the screen to begin imaging the sample.


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